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Direct Visible Light Inspection Lamp - Zosika AKL-265MEH

2026-10-21 08:57:48

Zorsika AKL-265MEH · Replacement for MORITEX MH-250H, Equivalent Grade UV Light Source

DC 265W · 7500K · MEJIRO BMH-352 Light Source Unit

Direct Visible Light Inspection Lamp

Item ZORSIKA AKL-265MEH MORITEX MH-250H
Light Source Type 265W 265W
Type Short-arc metal halide lamp with built-in reflector Short-arc metal halide lamp with built-in reflector
Color Temperature 7500K (spectrum close to natural light) 7500K
Drive Method DC-driven, flicker-free DC power supply, flicker-free
Average Lifetime Approx. 1,500 hours Approx. 2,000 hours
Compatible Main Unit MEJIRO BMH-352 Light Source Unit MEJIRO BMH-352 Light Source Unit

1. Aligned Optical Specifications at the Same Grade — Ready to Use upon Installation

The three core indicators — DC 265W power, 7500K simulated-daylight color temperature, and 4,000 lm initial luminous flux — are fully identical to the NTP-265, allowing direct installation into same-grade light boxes such as the HIBIKI HC-M265 and Sumita LS-M265, with no need to modify fixtures or adjust the optical path.

2. Integrated Design with Built-in Reflector for a Uniform, Stable Light Spot

Featuring a short-arc structure with a built-in parabolic reflector, it offers high light-convergence efficiency and a gentle falloff at the spot edges, making it ideal for inspection stations with stringent uniformity requirements.

3. Japanese OEM-Grade Manufacturing Backed by ZORSIKA Quality Control

ZORSIKA has maintained direct partnerships with leading original light source manufacturers such as Philips, Osram, PHOENIX (Japan), and USHIO. Its proprietary light sources use materials and packaging processes benchmarked against OEM standards, with lamp-core brightness reaching over 95% of OEM lamps.

4. Comprehensive Value of a Domestic Alternative

Compared with imported OEM lamps, the AKL-265 delivers same-grade optical performance while significantly reducing procurement costs and lead-time dependency — particularly suitable for production lines with multiple machines and frequent lamp replacements.

Application Scenarios:

  • ▪ Display Panel Industry: LCD/OLED panel surface defect inspection, Mura inspection, and lamination bubble detection
  • ▪ Semiconductor & Precision Electronics: wafer surface inspection, IC package appearance inspection, and PCB solder joint AOI
  • ▪ Optical Component Inspection: inspection of defects and coating uniformity on lenses, prisms, and filters
  • ▪ Simple UV / Visible-Light Local Curing: visible-light auxiliary exposure stations in small photocuring equipment
  • ▪ Laboratory Optical Equipment: microscope coaxial illumination, spectral calibration, and material surface reflectance testing
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